CEION® nanometre metal loss and electrochemical technology
CEION® is the state-of-the-art technology to detect material loss and electrochemical conditions at the metal-solution interface. Exceptional instrumentation yields performance in the sub-nanometre (<10-9m) domain with resolutions equivalent to the atomic radii of iron (125 picometre).
The theory of operation is based on the mobility of electrons and resultant changes in current density due to surface defects, inclusions, strain, conductive deposits or solutions in contact with and influencing an electrically conductive path through a metallic sample.
The ac excitation and impedance response provides a signal-conditioned calibrated output configured to resolve parameters of interest.
Precision electronics, inherent noise rejection and configurable embedded real-time compensation algorithms combine with micro-structurally, thermodynamically and hydrostatically balanced sensors.
Application
This technology is applied to the study of real-time conditions and behaviour at the metal-solution interface related primarily to combinations of corrosivity, erosivity, deposition, films and solution conductivity.
